產品名稱：Atomic Force Microscopy and Scanning Probe Microscopy Calibration

X-Y calibration with 2,160 lines/mm crossed line grating replica mounted on a 12mm disc. This Grating Replica is made of cellulose acetate. Made on a 400 square mesh, 3mm copper TEM grid

Prod #	Description	Unit

607-AFM

X-Y Cross Line Grating Replica, mounted on 12mm Specimen Disc

each

607-STM

X-Y Cross Line Grating Replica, Carbon/Au/Pd Coated, mounted on 12mm specimen disc

each

Highly Oriented Pyrolytic Graphite – HOPG

HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopes (SPM, STM and AFM). It may also be used as a calibration specimen. HOPG consists of layered planes of carbon atoms (002) which are highly oriented with respect to each

HOPG grade ZYH with a mosaic spread of 3.5° ± 1.5° with a grain size of 30-40nm
HOPG grade ZYB with a mosaic spread of 1.2° ± 0.2° with a grain size of up to 1µm
HOPG grade ZYA with a mosaic spread of 0.8° ± 0.2° with a grain size ranging up to 10µm

Prod #	Description	Unit

626

HOPG grade ZYH, 10x10mmx2mm

each

626-1

HOPG grade ZYB, 10x10mmx2mm

each

626-2

HOPG grade ZYA, 10x10mmx1.5mm

each

PELCO® AFM Tip and Resolution Test Specimen

A single later of colloidal cobalt particles provide an excellent substrate for AFM tip characterization and instrument operation. Image at top demonstrates height calibration at 1nm (red line profile) and 3nm (green line profile) on the standard.

Available on 5x5mm silicon wafer chips, unmounted or mounted, on 12mm stainless steel metal disk. Tip characterization down to angstrom resolution is easily attained. Ready-to-scan test specimen.

Prod #	Description	Unit

628

PELCO® AFM Tip and Resolution Test Specimen, Unmounted

each

628-AFM

PELCO® AFM Tip and Resolution Test Specimen, Mount AFM

each

TipChecker for AFM probes

When imaging a sample by AFM, it is imperative to know the condition of the AFM probe, since this determines the quality and correctness of the image. The TipChecker is an SPM sample for fast, convenient and efficient determination of the AFM tip condition. The clear differences between the tips becomes apparent even with a single scan line. The TipChecker offers a fast and easy way to compare and categorize different AFM tips with respect to tip apex, shape and sharpness. The TipChecker sample enables checking if the tip is still good, starts showing wear or is blunted or broken without the need for scanning an entire image or using SEM inspection. The Tipchecker sample works perfectly with Auto Tip Qualification and Tip Characterization software that is available on the market.
 

Figures showing a comparison between different AFM probe tips used to image the TipChecker sample. Scan is 1x1µm for all images, height is 100nm. Each image is shown with a representative cross-section scan.

The BudgetSensors TipChecker sample consists of an extremely wear-resistant thin film coating deposited on a silicon chip. The thin film coating shows a granular, sharply peaked nanostructure ideal for reversely imaging an AFM probe's apex. The die size of the BudgetSensors TipChecker is 5x5mm and comes glued onto a 12mm diameter, stainless steel, magnetic disc, ready to be placed into your AFM set.

Prod #	Description	Unit

TC1

BudgetSensors TipChecker for AFM probes

each

HS-Series AFM Calibration Standards

Step heights of 20, 100 or 500nm.

The HS-series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z-axis calibration the standards also offer X- and Y-axis calibration for bigger scanners in the 40-100um range. The structure symmetry enables calibration without the need to rotate and re-align the sample in between x- and Y-axis calibration.
The HS-series feature silicon dioxide structure arrays on a 5x5mm silicon chip. The fabrication process ensures excellent uniformity of the structures across the chip. There are three step heights available with nominal values of: 20nm, 100nm, and 500nm. The actual value will be supplied with the delivered calibration standard. Arrays of structures with different shape and pitch are integrated on the chip. The larger square of 1 x 1mm contains square pillars and holes with a 10um pitch. The smaller center square of 500 x 500µm contains circular pillars and holes as well as lines in both X- and Y-direction with a 5um pitch.

The silicon chips are available unmounted or mounted on a 12mm standard AFM disc using a high quality electrically conductive epoxy.

Prod #	Description	Unit

HS-20MG

AFM Calibration Standard, step height 20nm, mounted

each

HS-20MG-UM

AFM Calibration Standard, step height 20nm, unmounted

each

HS-100MG

AFM Calibration Standard, step height 100nm, mounted

each

HS-100MG-UM

AFM Calibration Standard, step height 100nm, unmounted

each

HS-500MG

AFM Calibration Standard, step height 500nm, mounted

each

HS-500MG-UM

AFM Calibration Standard, step height 500nm, unmounted

each

CS AFM XYZ Calibration StandardThe CS-20NG represents an advanced XYZ calibration grid that enables reliable calibration of AFM systems down to the nanometer level. The XYZ calibration standard features silicon dioxide structures on a 5x5mm silicon chip. The calibration area is in the middle of the chip and can be easily located by the optical system of the AFM. The structure step height is in the range of 20nm. The actual height value will be supplied with the delivered calibration standard. CS-20NG has three different x-y array sizes, all with the same 20nm height. The large 1x1mm square contains square pillars and holes with a 10µm pitch. The middle square contains circular pillars, holes and lines with a 5µm pitch. The small central area contains circular holes with a 500nm pitch. The CS-20NG is suitable for both lateral and vertical AFM scanner calibration. The structure symmetry enables calibration in one step without the need to rotate the sample between X- and Y-calibration.The XYZ calibration standard is mounted on a 12mm, standard AFM disc using a high quality electrically conductive epoxy resin.

Prod #	Description	Unit

HS-20NG

AFM XYZ Calibration Standard, mounted on a 12mm AFM disk

each