產品名稱：SEM/X-Ray Calibration (X-CHECKER)

X-CHECKER

monitor Energy Dispersive Spectrometer/SEM systems

X-Checker™ is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. X-Checker™ contains a series of standard materials on a 1” diameter aluminum stub. With X-Checker, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software. When was the last time you checked the performance of your EDS system?

The 602 contains manganese to measure full width at half max detector resolution, aluminum and copper to check spectral calibration, and carbon to monitor calibration at the low end of the spectrum for thin window detectors.

Two nickel TEM grid sizes, 40x40 µm and 18x18µm, with ±5% accuracy, are furnished for checking image analysis software calibration. They also facilitate an easy test for monitoring the amount of vacuum pump oil contamination on the detector window.

Instruction booklet and padded storage case. 25mm diameter x 10mm height.

The addition of boron nitride to the 602-2 adds a more sensitive monitor of low end performance on thin window and windowless detectors.

Prod #	Description	Unit

602

X-CHECKER

each

602-2

X-CHECKER, B

each

X-CHECKER EXTRA