產品詳情
查看大圖

  • 產品名稱：PELCO®NiOx用於分析電子顯微鏡（AEM）

  • 產品型號：650
  • 產品廠商：其它品牌
  • 產品文檔：
你添加了1件商品 查看購物車
簡單介紹：
Spurious X-rays (dashed trajectories) created when scattered electrons strike a grid bar (not to scale) or and objective aperture, or by fluorescence of the grid by column X-rays.
詳情介紹：

The NiOx Test Specimen has been developed for advanced analytical TEM's equipped with X-Ray Micro Analysis Systems (EDX) and/or Electron Energy Loss Spectrometers (EELS) to characterize instrument performance. The NiOx Test Specimen is valuable in at least three ways:

1. When evaluating TEM's and EDX systems prior to purchase.
2.

Immediately after installation of the EDX detector, to check that column conditions and detector alignment are satisfactory.

3.

Periodically during operation of the system, to check for possible icing or hydrocarbon contamination on the detector.

The test specimen provides an Mo signal to measure stray X-rays and electrons present in the TEM column. The NiO film contains a known amount of a light element (oxygen) and is used for evaluation the EDX detector response to low energy X-rays. In EELS, the oxygen and nickel ionization edges allow energy-axis calibration and elemental-ratio measurements to be performed. It is possible to make a direct comparison of elemental analyses obtained by EDX and EELS for a TEM equipped with both systems.
 

Typical EDX spectrum for a 55nm specimen of NiO on a 300-mesh Mo grid, coated with 25nm C, with the 200 keV incident beam near the center of a grid square. The small Fe Ka: peak is generated by the microscope column (perhaps objective pole-pieces).(reprinted with permission)

Since the nickel oxide film is a fine-grained polycrystal, it is well suited to the calibration of TEM camera length and the correction of intermediate-lens astigmatism.
Each specimen is packaged in an aluminum storage container with instructions for the measurement of camera length, evaluating the amount of stray radiation in the TEM column and its predominant character (X-rays or electrons), for estimating the collection solid angle of the EDX detector and for determining the extent of ice or hydrocarbon contamination on the detector.

  1. Egerton RF, Cheng SC, (1994) Characterization of an analytical electron microscope with a NiO test specimen. Ultramicroscopy, 55 43-54.
  2. Bennett JC, Cheng SC, Egerton R, July 1994. The use of NiO test specimens in analytical electron microscopy. ICEM 13-Paris, 17-22 , 613-614.
  3. Bennett JC, Cheng SC, 1995. NiO test specimens for analytical electron microscopy. Round Robin results. JMSA, 1, 44, 143-149.
    Prod # Description Unit
    650
    		PELCO® NiOx Test Specimen
    each

滬公網安備 31010902002433號