产品名称：BSE原子参考

BSE Atomic Reference Specimen

When equipped with a back-scattered electron detector, an electron microscope has the capability to produce images in which the contrast is controlled by differences in atomic number across the specimen.

Three reference specimens are now available that are suitable for testing the atomic number contrast performance. Each of the reference specimens consists of two high purity elements that have an atomic number difference of 1. They are in the form of a wire of the low Z element embedded in a matrix of the high Z element.

The specimens are available as a single mount either 3mm or 5mm diameter or can be incorporated into a block of standards.

Prod #	Description	Unit

652

BSE Atomic Reference, Nickel (Z-28) - Copper (Z-29)

each

653

BSE Atomic Reference, Palladium (Z-46) - Silver (Z-47)

each

654

BSE Atomic Reference, Platinum (Z-78) - Gold (Z-79)

each

Duplex Reference Specimen

An alternative and very sensitive test is by means of an alloy with two major copper/zinc phases separated by an atomic number difference of 0.1. The light phase illustrated in the micrograph has a mean atomic number of 29.47 and the dark phase a mean atomic number of 29.37.

Prod #	Description	Unit

655

Duplex Reference Specimen

each