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  • 产品名称：Omniprobe电镜配件 Auto-Probe Accessories

  • 产品型号：460-306
  • 产品厂商：其它品牌
  • 产品文档：
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简单介绍：
1.Double TEM Grid Holder The Double TEM Grid Holder holds two lift-out grids and has a spring-loaded jaw for easy unloading. This holder has a short standard pin style post base: ø3.2 x 4mm length (1/
详情介绍：
1.Double TEM Grid Holder
The Double TEM Grid Holder holds two lift-out grids and has a spring-loaded jaw for easy unloading. This holder has a short standard pin style post base: ø3.2 x 4mm length (1/8" x 0.15") to accommodate thinner-type stage plates used in full wafer systems. Available with non-magnetic stainless steel or aluminum body. NM= non magnetic.
 
Prod #
Description
Unit
460-306
Double TEM Grid Holder, NM-SS
 each
460-307
Double TEM Grid Holder, Al
 each
 
2.Double TEM Grid and Sample Holder
TEM grid and sample holder for FIB and SEM/FIB (DualBeam™ and CrossBeam®) systems with stations for 2 TEM lift-out grids and 2 sample mounts. This holder has a standard pin style post base: ø3.2 x 8.1mm length (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter. Available with non-magnetic stainless steel or aluminum body.
Prod #
Description
Unit
460-308
Double TEM Grid and Sample Holder, NM-SS
 each
460-309
Double TEM Grid and Sample Holder, Al
 each
 
3.Single Sample and Grid Holder
Single sample and TEM grid holder for FIB and SEM/FIB systems with stations for two TEM lift-out grids and one sample mount. This holder has a standard pin style post base: 3.2 x 8.1mm (1/8" x 0.32") compatible with most standard pin stub holders. The Low Profile FIB Sample Mounts have a standard 12.7mm (1/2") diameter.
Available with non-magnetic stainless steel or aluminum body.
 
Prod #
Description
Unit
460-312
Double TEM Grid and Single Sample Holder, NM-SS
 each
460-313
Double TEM Grid and Single Sample Holder, Al
 each

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